question 4 only What is testing Why do we need it What are t

question 4 only

What is testing? Why do we need it? What are the four classes of errors that can occur in a digital system? For each class, give an example. What is the difference between a physical fault and a logical fault? Give an example that illustrates the |difference. Briefly explain what the following terms mean: On-line testing Stored-pattern testing Algorithmic testing DC testing At-speed testing Compact testing Guided-probe testing Self-testing Fault Coverage Fault Universe Problem 2.1, 2.2 from the textbook What is a non-procedure RTL language and why do we need it? Problem 3.1, 3.3 from the textbook What is the difference between transport and inertial delays? Illustrate with an example.

Solution

a. Online testing:

online testing means an application performance can be estimated when it is in online. It is like a e- activity. it connects to the another system or collect data form the user or how the specified functionaly can be performed by the system.How it works on stand alone mode or online mode both can be estimated.

Stored pattern Testing:

A stored pattern testing testing is includes a memory storage apattern includes in in testing. The test controller controls the test access port to load the test into the scan chain, and receives and evaluates response data from the device under test.

Algorithamic Test:

A computational method for identifying test cases from data logical relationships or
other software requirements information. In nthis testing effiency of the application
is estimated and as per the requirement implemention is done. When the algorithm is effienctly
meets our requirements then the application scalability is increased.

DC Testing:

In expansion fo DC testing means Decision Coverage testing method, this is aimed to
each one of the possible point in each decision point is executed at least once.
in this every decision is true or false. this helps us to validating all the branches
in the code making sure that no abnormal behavioual application leads.

At speed testing:

at speed testing is older technique this were done in the past by using functional test patterns.
these are very difficult to create and so much work is needed. It needs to create successful pattersn
problem in this testing is daignosing the source of gailue when functional pattern fail.

Compact Testing:

compact testing compares the contents of the files databases against the given produced resultes and actula results.These are capable of highlighting the diff between expcetd and actula results. These are having functions specifically sections on files masked.

Guided Probe:guided probe testing has a simple startegy to locate the faults in apploicaion.
These are identified faults affecting lines and paths of the error. In this testing
application is tested deeply and this is very hard to test.

Self test: A self test means it is testde by it slef and detect the malfunction or missing component
or any chnage in the applciation context or configuration.

Faulkt Coverage: A fault coverage is percentage of fault that cna be detected during the test of anybody
engineering application. This is most valuable manufactuing test during making.