In the CMOS gate given below derive a a test to detect the w
In the CMOS gate given below derive:
(a) a test to detect the wire marked with an X open
(b) a test to detect the PFET driven by input A stuck-on such that gate output voltage deviates maximally from the fault free output voltage
(c) a test to detect the NFET driven by input D stuck-open
Solution
Ans a is the correct one
