Plasma etching is essential to the fineline pattern transfer
Plasma etching is essential to the fine-line pattern transfer in current semiconductor processes. An article gives the accompanying data (read from a graph) on chlorine flow (x, in SCCM) through a nozzle used in the etching mechanism and etch rate (y, in 100 A/min).
The summary statistics are
(a) Does the simple linear regression model specify a useful relationship between chlorine flow and etch rate? (Use = 0.05.)
State the appropriate null and alternative hypotheses.
H0: 1 = 0
Ha: 1 < 0H0: 1 0
Ha: 1 = 0 H0: 1 = 0
Ha: 1 0H0: 1 = 0
Ha: 1 > 0
Calculate the test statistic and determine the P-value. (Round your test statistic to two decimal places and your P-value to three decimal places.)
State the conclusion in the problem context.
Reject H0. This model does not specify a useful relationship between chlorine flow and etch rate.
Fail to reject H0. This model does not specify a useful relationship between chlorine flow and etch rate.
Fail to reject H0. This model does specify a useful relationship between chlorine flow and etch rate.
Reject H0. This model does specify a useful relationship between chlorine flow and etch rate.
(b) Estimate the true average change in etch rate associated with a 1-SCCM increase in flow rate using a 95% confidence interval. (Round your answers to three decimal places.)
(c) Calculate a 95% CI for Y · 3.0,
the true average etch rate when flow = 3.0. (Round your answers to three decimal places.)
(d) Calculate a 95% PI for a single future observation on etch rate to be made when flow = 3.0. (Round your answers to three decimal places.)
(e) Would the 95% CI and PI when flow = 2.5 be wider or narrower than the corresponding intervals of parts (c) and (d)? Answer without actually computing the intervals.
| x | 1.5 | 1.5 | 2.0 | 2.5 | 2.5 | 3.0 | 3.5 | 3.5 | 4.0 |
| y | 24.0 | 24.5 | 25.5 | 30.0 | 33.5 | 39.5 | 40.5 | 46.0 | 49.5 |
Solution
a) the appropriate null and alternative hypotheses.is
Ha: 1 0H0: 1 = 0
t-value = 11.33
P-value = 0.000
conclusion: Reject H0. This model does specify a useful relationship between chlorine flow and etch rate.
b)
The 95% CI for Y · 3.0, is (36.253,40.183)
c) Predicted value = 7.2564+(10.3205*3)= 38.2179
A 95% PI for a single future observation on etch rate to be made when flow = 3.0 is (32.388, 44.048)
d)
The predicted value at x=2.5 is 7.2564+(10.3205*2.5)= 33.0577
the 95% CI and PI when flow = 2.5 be narrower than the corresponding intervals of parts (c) and (d)

